• ISA provides technical resources and standards to help industrial automation professionals advance their careers and the field. We enable automation professionals worldwide to solve problems and enhance their skills by bringing people together to create new technologies and share best practices with future automation professionals.
    • Industry Insights

  • We attract over 140,000 unique automation professionals monthly, making us the premier online content provider and the only dedicated electronic magazine in the automation industry.

    Monthly Magazine

    Back
    Back
  • M logo for Automation.com Monthly. Link to current issue.

Keithley Enhances S530 Parametric Test System Software

Source: Keithley Instruments
14 January, 2014
Keithley Enhances S530 Parametric Test System Software
Keithley Enhances S530 Parametric Test System Software
Enhancements include the S530 Diagnostics and System Verification Tool for GUI-driven tool diagnostic coverage for system instrumentation and matrix pathways.

January 14, 2014 – Keithley Instruments introduced upgrades to its S530 Parametric Test Systems for high-speed production parametric test.

S530 Diagnostics and System Verification Tool

This GUI-driven tool expands diagnostic coverage for all system instrumentation and matrix pathways, providing greater confidence in the health of the system. Additionally, users can run the system verification tool to ensure the S530 is within its published system specifications. The diagnostic and system verification tool generates comprehensive results files, making it easier to share information with Keithley field service personnel or monitor trends in system health. Overall, the new tool improves the user’s experience with the S530, while driving down total cost of ownership.

Expanded Measurement Capabilities

The upgrade includes a variety of new measurement capabilities and added flexibility to the Keithley Test Environment (KTE). The commands used in the KTE linear parametric test library (LPTLIB) and parametric test library (PARLIB) build on the advantages of Keithley’s three decades of field experience in parametric test code development. S530 Parametric Test Systems running the new KTE V5.5 can address all of the I-V and C-V measurements required in process control monitoring, process reliability monitoring, and device characterization.

S530 Applications

S530 systems are optimized for use in production parametric test environments that must accommodate a broad mix of products or wherever wide application flexibility and fast test plan development are critical. In addition to the 200V system configuration that is typically used for standard CMOS, bipolar, MEMS, and other relatively low voltage semiconductor processes, Keithley developed a 1kV version optimized for the difficult breakdown and leakage tests that GaN, SiC, and Si LDMOS power devices demand. To accommodate this expansion of the system’s range of applications, Keithley has also developed a taller system cabinet designed to house additional instrumentation and simplify overall system maintenance.

Trending Articles

Advertisement

Related Industry Products

View all Industry Products
Advertisement
Advertisement