The optoCONTROL 2520 compact optical laser micrometer with integrated controller can be combined with the CSP2008 multi-function controller. This enables the thickness and diameter of large objects to be measured. The measurement values are calculated by the controller after detection by the optical micrometer. The display on the CSP2008 shows the values of each micrometer as well as the thickness measurement (absolute dimension). In total, up to six systems can be connected to the CSP2008 via plug-and-play.
The user-friendly, Ethernet-based web interface simplifies handling and integration, as well as remote access to the production process. The optoCONROL 2520 is ideally suited to a wide range of applications in quality control and production.
