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Keithley Instruments announces Winners of Nanotech measurement contest
The contest objective was to foster development and propagation of improved test techniques to advance nanotech measurement art. Researchers who submitted entries are making complex and advanced measurements for applications as diverse as characterization of carbon nanotubes, electrical contact resistance, electrode spacing via atomic layer deposition, characterization of semiconductor junctions, and studies of nanoscale electrochemical modification in electronic devices. -
Siemens announces 2007 Automation Summit
The Siemens Automation Summit will be held June 12-15, 2007 at Disney's Coronado Springs Resort in Orlando. The theme of this year's event is "Automation, Innovation, Inspiration." -
ODVA upgrades its website
The site offers improved navigation, secure order entry, search capability and an interactive calendar to keep industry informed about all of ODVA’s activities worldwide. -
ASI releases Printing and Labeling System brochure
Brochure covers three printing and labeling systems for use in industrial applications such as terminal block labels, wire markers, cable tags, switch and pilot light name plates, equipment labels and component labels. -
Advantech to co-sponsor Automotive Research Lab at Penn State
Advantech will co-sponsor an automotive research lab administered by the Pennsylvania Transportation Institute at Penn State. This project develops a campus-wide hardware-in-the-loop (HIL) capability to test advanced vehicle powertrains and controllers. Advantech will supply industrial PCs, embedded PCs and accessories.
