Articles and News

Fletcher’s 2-hour talk, called “How Vision Sensors Are Being Applied to Improve the Quality of Formed and Fabricated Metal Parts” includes plenty of stories and pictures from the shop floor, including hole, burr, and slug detection. Fletcher will discuss how to determine if an application is a good candidate for a vision inspection and how to select the right sensor, lighting, and lens.

Intergraph Corporation announced that the American Red Cross presented the Company with the Circle of Humanitarian Award, the organization's highest award honoring financial assistance, for its support of disaster relief efforts in the wake of Hurricane Katrina. The award was presented by Rick Cantrell, executive director of the Madison/Marshall County Chapter of the American Red Cross, and received by R. Halsey Wise, president and CEO, Intergraph.

Indacomp specializes in custom automation applications for a variety of industries. The transaction will bring Indacomp into the Litzler Group as Litzler Automation. Litzler Automation will serve existing Litzler customers with high quality drives and control systems and existing Indacomp customers with expanded automation solutions.

The company, Egypt's only manufacturer of carbon black, installed the new line to meet increased demand for its carbon black products which are used in the manufacture of tires, rubber products, plastics, inks, dyes and paints. The Alexandria Carbon Black Company is the fastest growing carbon black producer in the world with over 90% of production being exported to companies that include Goodyear, Michelin, Bridgestone, Pirelli, Dunlop and Continental Tire.

National Instruments Director of Product Marketing Eric Starkloff will deliver a keynote address to design engineers and industry experts at the D2M 2006 conference, co-located with the Embedded Systems Conference, in San Jose, Calif., on April 5. In his keynote address, “Making Test Disappear: Leading Examples of Transparency between Design and Test,” Starkloff outlines a vision of software-based virtual instrumentation that can drastically reduce test development time.